Friday Workshop at DATE 2007

CALL FOR PAPERS

Overview -- Workshop Description -- Author Information -- Information

Overview

The Design, Automation, and Test in Europe conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems. The conference includes plenary invited papers, regular papers, panels, hot-topic sessions, tutorials and workshops, two special focus days and a track for executives. Friday Workshops are focusing on emerging research and application topics. At DATE 2007, one of the Friday Workshops is devoted to Diagnostic Services in Network-on-Chips. This one-day event consists of a plenary keynote, regular and poster presentations, and a panel session.

Workshop Description

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Network-on-Chips (NoCs) are emerging as a new on-chip communication paradigm. Diagnostic services, such as test, debug, and on-line monitoring, are becoming an important factor in designing next-generation NoC-based systems. The NoC infrastructure itself requires diagnostic services, and can also be used to support those for the entire system. Although significant research has been done in NoC design, there are many open and pressing issues regarding diagnostic services. The focus of this workshop is to explore them and their implications on system design.

Topic Areas

You are invited to participate and submit your contributions to the DATE 2007 Friday Workshop on
Diagnostic Services in Network-on-Chips. The area of interest includes (but is not limited to) the following topics:

Manufacturing test of NoC infrastructure
Reuse of NoC for test and diagnostic services
Debug for OS and application software
Fault-tolerant approaches to NoC design
Design of soft-error-hardened NoCs
On-line monitoring of NoC reliability
On-line performance monitoring
Silicon debug and diagnosis of NoC infrastructure
Tools and methods to NOC diagnostic services
Infrastructure IP for Diagnostic Services in NoCs

Author Information

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Submissions are invited in the form of (extended) abstracts not exceeding two pages and must be sent in as PDF file to <axel@kth.se> and <nicola@ece.mcmaster.ca> with “DATE07WS” as subject. All submissions will be evaluated for selection with regard to their suitability for the workshop, originality, and technical soundness. Selected submissions can be accepted for regular or poster presentation. At the workshop, an electronic Digest of Contributions will be made available to all workshop participants which will include all material that authors are willing to provide: paper, abstract, slides, poster, etc.

Paper Submission deadline: October 10, 2006
Notification of Acceptance: November 10, 2006
Camera-Ready Material due date: March 31, 2007

Information

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Erik Jan Marinissen
General Chair
NXP Semiconductors
Corporate Research
High Tech Campus 5 (M/S WAY-41)
5656AE Eindhoven, The Netherlands
E-mail: erik.jan.marinissen@philips.com

Axel Jantsch
Program Co-Chair
Royal Institute of Technology
Department of ECS
School for Information and Communication Technology
Electrum 229, SE-164 40 Kista, Sweden
E-mail: axel@kth.se

Nicola Nicolici
Program Co-Chair
McMaster University
Department of ECE
1280 Main Street West – ITB/A210
Hamilton, ON L8S 4K1, Canada
E-mail: nicola@ece.mcmaster.ca

For more information, visit us on the web at: http://www.date-conference.com/

The Design, Automation and Test in Europe Conference and Exhibition (DATE 2007) is sponsored by the European Design and Automation Association, the EDA Consortium, the IEEE Computer Society (TTTC), (CEDA), ECSI, RAS and ACM SIGDA.